Enabling Advanced Technologies with Ellipsometry
Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications. This widespread use is explained by increased dependence on thin films in many areas and the flexibility of ellipsometry to measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biological coatings, and composites of materials. Learn how ellipsometry enables extreme precision in touchscreen and AR hardware development, and supports high‑uniformity coating for displays at scale. This makes it ideal for a number of industries including Defence, Aerospace, Pharmaceuticals, Food Processing, Quantum and more…
alpha 2.0 Ellipsometer for spectral range of 400-1000 nm
M2000 Ellipsometer for thin film characterisation
theta SE Ellipsometer for characterising thin film uniformity
RC2 Ellipsometer with dual rotating compensator technology
IR VASE II Ellipsometer for thin films and bulk materials characterisation
VUV VASE Ellipsometer covering the vacuum UV to the NIR
iSE Ellipsometer for real-time monitoring of thin film processing
Stealth Coating Using Spectroscopic Ellipsometry
Stealth technology relies on reducing the detectability of objects—particularly to radar and infrared (IR) sensors—by manipulating surface materials to minimise reflected and emitted signals. A critical tool in developing and characterising such materials is the J.A. Woollam IR-VASE II spectroscopic ellipsometer, a sophisticated instrument designed for precise, non-destructive optical measurements in the infrared range (1.7 to 30+ microns). This capability makes it particularly valuable for assessing and engineering stealth coatings.
The IR-VASE® is the first and only spectroscopic ellipsometer to combine the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the wide spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). It is used to characterise both thin films and bulk materials in research and industry. This rapidly growing technology is finding uses in the optical coatings, semiconductor, biological and chemical industries, as well as research labs.
J. A. Woollam IR-VASE® II
How the Tyndall National Institute in Cork Uses Spectroscopic Ellipsometry in Their Research
The Tyndall National Institute, based in Cork, is a leading European research centre focused on advanced electronics, photonics, and materials science. Their work spans from fundamental materials development to device fabrication and modelling in cleanroom environments, with a strong emphasis on photonic technologies for telecoms, quantum, sensing, and energy applications.
ALL APPLICATIONS
Defence and Security
Aerospace
Quantum Science and Technology
Space and Astronomy
Semiconductors
Agriculture
Non-Destructive Testing
