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J. A. Woollam alpha 2.0 Spectroscopic Ellipsometer
Ellipsometer for spectral range of 400-1000 nm
The alpha 2.0 is a budget-friendly option for routine measurements of thin film thickness and refractive index. A compact footprint and simple design make the alpha 2.0 easy to use while harnessing the power of spectroscopic ellipsometry. It was designed for ease-of-use: simply place the sample on the stage, choose the model that matches your film, click “measure”, and you will have results within seconds.
FEATURES
- Easy-to-Use
Push-button operation is complemented by advanced
software that takes care of the work for you. - Powerful
Proven spectroscopic ellipsometer technology gives you
both thickness and refractive index with much higher
certainty than other techniques. - +Flexible
It works with your materials – dielectrics,
semiconductors, organics, and more. - Affordable
A streamlined instrument created for research and
development of simple samples. - Fast
Simultaneous collection of 190 wavelengths for highspeed, multi-angle ellipsometry measurements.
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SPECIFICATIONS
| Spectral Range | 400 nm to 1000 nm, 190 wavelengths |
| Angle of Incidence | • Manual adjustment • 65°, 70°, 75°, or 90° (straight-through) |
| System Overview | • Dual-Rotation optical design • CCD detection • Automated sample alignment |
| Sample Size | The alpha 2.0 accommodates samples up to 200-mm diameter and 16-mm thick. |
| Data Acquisition Rate | • 5-10 seconds for full spectrum [typical] |
| Software | CompleteEASE for data acquisition, data analysis, and optical simulations |
| Beam Diameter | • Focused: < 1 mm |
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Supplier Info
Applications
Coatings on Glass
Patented technology allows accurate measurements on any substrate: metal, semiconductor, or glass. For transparent substrates, the alpha 2.0 simultaneously measures depolarisation to correct for light returning from the backside of the substrate. This unwanted light can confuse other ellipsometers, but the alpha 2.0 ensures accurate thickness and optical constants.
Self-Assembled Monolayers
Phase information of a spectroscopic ellipsometry measurement is highly sensitive to very thin films (<10 nm). For example, self-assembled monolayers can be measured and quickly compared using the alpha 2.0.
Absorbing Films
Advanced models allow quick and efficient fits for a wide variety of absorbing materials. Materials: +a-Si, +poly-Si, +Diamond-like carbon, +Organic materials, +Organic LED films, +SiC, +Photoresist, +Display colour filters, +Metals Models: +Lorentz, +Gaussian, +Drude, +Tauc-Lorentz, +B-Spline
Transparent Films
With fast measurement speeds and push-button operation, the alpha 2.0 is ideal for qualifying transparent thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds. Log results for easy-to-use comparisons in both graphical and tabular formats.
