X-Ray analytical microscope with synchrotron capabilities
Sigray, Inc. develops advanced and completely new approaches to x-ray technology that formerly could only be found in synchrotron beamline experimental setups. The µ-XRF system from Sigray, AttoMap™ combines the resolution and the sensitivity from synchrotron XRF results and combines them into a laboratory-based instrument. Beside the AttoMap™ x-ray fluorescence system, Sigray is also offering proprietary x-ray optics and a new and breakthrough x-ray source named FAAST™.
The AttoMap™ x-ray analytical microscope offers the highest resolution and the highest sensitivity one can find in a laboratory based microXRF system. The AttoMap™ system can be used for transmission-based x-ray structural analysis as well as for fluorescence chemical mapping. The system has a chemical sensitivity of <1-10 ppm for trace element analysis and the measuring time is within 1 second.
The patented FAAST™ microfocus x-ray source (Fine Anode Array Source Technology) is based on a complete new x-ray source design. The x-ray target is made out of fine metal microstructures that are encapsulated in a diamond substrate. This complete new design was enabled due to recent developments in semiconductor processing techniques.
- The patented FAAST™ x-ray source with 50X higher brightness than microfocus sources used in standard microXRFs
- Proprietary, high efficiency x-ray mirror lens that provides a combination of small achromatic focus and large working distance for superior detection sensitivity and accuracy
- Unique detector geometry enabled by the design of the x-ray mirror lens that collects 10X more fluorescence x-rays than conventional designs.
The Sigray AttoMap is a breakthrough in compositional mapping and quantification for the most challenging samples and applications.
Nanoparticles (in materials science, nanoparticle-based drug delivery, and more)
Mineralogy (e.g. clays and trace minerals, rare earth elements in geochronology, tailings in mining)
Advanced materials development (polymers/plastics, ceramics, batteries)
Biological metallomics (distribution of trace elements within pathological tissues and cells
Semiconductor trace metal and contamination mapping in process development, failure analysis, and process monitoring for both front-end and back-end packaging applications.
FAAST Source >50x brightness & dual energy with novel energies.
The AttoMap uses the patented Sigray FAAST (Fine Array Anode Source Technology), which features an innovative xray target comprised of fine microstructured metal x-ray emitters embedded in a diamond substrate. The target is designed to combine the advantages of: n Rapid thermal dissipation, provided by high degree of contact between the microstructures and diamond (thermal conductivity: 22 W/cm2 ) to enable highly localized thermal gradients so that the target remains cool under high power loading, with the n Linear accumulation of x-rays through the largely x-ray transparent diamond substrate to enable near-zero takeoff angles that maximize source brightness. Additionally, the source provides access to new x-ray spectra using novel x-ray source target materials (e.g. Pt, Zr, Cr, etc). Choice of such materials is uniquely enabled by the thermal advantages of the FAAST design.
Proprietary twin paraboloidal x-ray mirror lens High efficiency with large working distances.
The Sigray twin paraboloidal x-ray mirror lens provides tremendous benefits over the standard polycapillary x-ray optic employed by existing microXRF systems. Sigray has developed a high precision and advanced manufacturing process capable of producing lenses with minimal slope errors and a reflecting surface smoothness on the order of single digit angstroms. The resulting lens provides high resolution and achromatic focusing (all x-ray energies produced by the source are focused into the same spot size) for accurate quantification at large working distances.
Innovative detector geometry
Correlative & up to 10x collection angle AttoMap features multiple detectors, with two standard microXRF detectors for compositional analysis and an x-ray camera for submicron structural imaging, empowering correlative analysis. The large solid angle of collection of the microXRF x-ray detectors in the Sigray setup is uniquely made possible by use of the twin paraboloidal x-ray mirror lens, which provides the long working distance and compact form factor needed for optimized placement of the detectors.