X-Ray analytical microscope with synchrotron capabilities
Sigray, Inc. develops advanced and completely new approaches to x-ray technology that formerly could only be found in synchrotron beamline experimental setups. The µ-XRF system from Sigray, AttoMap™ combines the resolution and the sensitivity from synchrotron XRF results and combines them into a laboratory-based instrument. Beside the AttoMap™ x-ray fluorescence system, Sigray is also offering proprietary x-ray optics and a new and breakthrough x-ray source named FAAST™.
The AttoMap™ x-ray analytical microscope offers the highest resolution and the highest sensitivity one can find in a laboratory based microXRF system. The AttoMap™ system can be used for transmission-based x-ray structural analysis as well as for fluorescence chemical mapping. The system has a chemical sensitivity of <1-10 ppm for trace element analysis and the measuring time is within 1 second.
The patented FAAST™ microfocus x-ray source (Fine Anode Array Source Technology) is based on a complete new x-ray source design. The x-ray target is made out of fine metal microstructures that are encapsulated in a diamond substrate. This complete new design was enabled due to recent developments in semiconductor processing techniques.
The powerful sensitivity and high resolution of the AttoMap produces synchrotron-quality elemental distribution mapping of trace elements for a wide range of research applications, spanning from the life and materials sciences to industrial use for pharmaceuticals, natural resources (oil and gas, mining) and semiconductor failure analysis. Visit Sigray's gallery