Nanoparticle analysis sits at the intersection of precision and complexity. Whether you’re working with magnetic nanoshells, 2D platelets, or densely packed agglomerates, extracting reliable data across a large sample can be slow, fragmented, and error-prone. Traditional workflows—relying on separate instruments—often force a trade-off between speed and depth.
A correlative approach changes that dynamic.
Why is Nanoparticle Analysis So Challenging?
Nanoparticles rarely cooperate. They tend to scatter randomly, cluster into agglomerates, and vary widely in size and shape. Screening large areas to find meaningful structures is time-intensive, and once you do find them, relocating the exact same particle across different instruments becomes another hurdle.
Scanning Electron Microscopy (SEM) is fast and excellent for imaging large populations, but it cannot reliably measure true particle height or nanoscale surface roughness. Atomic Force Microscopy (AFM), on the other hand, provides those quantitative details—but is too slow to scan entire populations efficiently. The result is a fragmented workflow with gaps in both efficiency and insight.
So how do you measure nanoparticle size and shape and then analyse nanoparticle agglomeration?
A Unified Workflow for Faster, Deeper Insights
The Quantum Design FusionScope® brings SEM, AFM, and optional Energy-Dispersive X-ray Spectroscopy (EDS) together into a single system. This integration eliminates the need to transfer samples between instruments, reducing contamination risks and saving significant time.
At the core of this workflow is a shared coordinate system. After scanning a large surface area with SEM, users can pinpoint regions of interest (ROIs) and return to them precisely with AFM—down to individual particles. This enables a powerful combination: fast, large-area screening followed by targeted, high-resolution measurements.
Adaptive Targeting Microscopy: Measure Only What Matters
One of the most impactful capabilities is adaptive targeting. Instead of blindly scanning with AFM, the system uses SEM data to guide measurement decisions.
For example, consider a 200 × 200 µm sample containing 2D platelets.
A raster of 15 × 15 µm AFM images would typically generate 169 scans. However, not all of these contain useful data:
- 111 images contain no particles
- 33 contain particles across the field
- 25 show individual particles clearly
With adaptive targeting, only 34 AFM measurements are actually needed. This dramatically reduces measurement time while ensuring that relevant particles are captured with high precision.
(200 x 200 µm)
(200 x 200 µm)
Stop Searching. Start Measuring.
Automated Particle Analysis for High-Throughput Workflows
Beyond manual targeting, the system also supports automated 2D platelet analysis. Using image recognition, it can:
- Detect and classify particles based on size thresholds
- Generate coordinate maps of particle locations
- Trigger automated SEM and AFM measurements
This level of automation is particularly valuable for industrial and research environments where consistency and throughput are critical.
What is the best method to measure and analyse nanoparticles?
Nanoparticles are rarely defined by a single property. Understanding their behaviour often requires correlating multiple characteristics, including:
- Size and morphology
- Surface roughness
- Electrical and mechanical properties
- Chemical composition (via EDS)
- Magnetic behaviour
- Distribution and agglomeration patterns
With the Quantum Design FusionScope, all of these can be explored within a single, unified workflow. For example, 200 nm magnetic gold nanoshells can be analysed to distinguish the silica core, magnetic nanoparticles, and outer gold shell—across multiple imaging and measurement modes.
High-resolution nanoparticle imaging: From Data Overload to Actionable Insight
By combining fast SEM screening with targeted AFM analysis, this approach transforms nanoparticle characterisation from a bottleneck into a streamlined process. Researchers and analysts can focus on meaningful data rather than wasting time on empty scans or lost regions of interest.
The result is not just faster workflows, but better science: more accurate measurements, richer datasets, and clearer correlations between structure and function.
FAQs
SEM is excellent for fast imaging and locating particles, but it cannot provide accurate height or surface roughness. AFM provides those details but is too slow for large-area screening. Combining both gives you speed and precision.
It uses a shared coordinate system, allowing precise navigation back to the exact region of interest without guesswork or manual repositioning.
Adaptive targeting uses SEM data to identify where particles are located, so AFM only scans relevant areas. This reduces measurement time and increases efficiency.
Yes. SEM quickly identifies dense regions and agglomerates, while AFM can then target specific particles within those clusters for detailed analysis.
You can analyse morphology, size, roughness, electrical and mechanical properties, chemical composition (with EDS), and even magnetic characteristics—all within the same system.
By reducing unnecessary scans, eliminating sample transfers, and enabling automation, the system significantly speeds up analysis while maintaining high data quality.
Yes. With automated particle detection, thresholding, and coordinated SEM-AFM measurements, the FusionScope is well-suited for high-throughput workflows.
Unlock the full potential of your sample
… contact our specialist, Dr. Luke Nicholls, by email below or call (01372) 378822.
No more AFM vs SEM for nanoparticle measurement debate… Discover the Quantum Design FusionScope SEM with AFM (and optional EDS…and even more)
