NOW FULLY BOOKED
We are celebrating 21 years of Spectroscopic Ellipsometry workshops with our partners, J A Woollam.
This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric data analysis, and an overview of ellipsometric applications in both research and production. New emerging applications are highlighted.
Application engineers from J A Woollam will give talks on the following topics:
- Theory and Fundamentals of Spectroscopic Ellipsometry
- Applications and Data Analysis Examples of Spectroscopic Ellipsometry
- Overview of J A Woollam Ellipsometers including the alpha-SE Ellipsometer
Scroll down for comprehensive preliminary agenda.
We can also do basic measurements on the day, so please do get in touch to get a sample submission form (any we can’t do on the day we will take away to do at the US factory).
One of our speakers, Dr. Nikolaos Kalfagiannis has recently published a Case Study, detailing the work of his iSMART research group, utilising the JA Woollam IR VASE II ellipsometer, provided by QDUKI…
As part of the partnership between Quantum Design and MTIF, which offers customers access the J A Woollam IR VASE II Spectroscopic Ellipsometer, this year’s Conference and Workshop on Spectroscopic Ellipsometry will be held at MTIF’s Research Centre located on Nottingham Trent University’s Clifton Campus. MTIF is a ISO 13485 certified medical technologies development organisation offering research and development services including thin film technology, printed electronics, nano-photonics, opto-electronic properties of materials and devices and laser processing.
“Excellent introduction to SE”Chris Morgans, Swansea University
Preliminary Workshop Agenda
|09:30||Registration and coffee|
|10:00||Introduction to Quantum Design UK and Ireland and J.A. Woollam | Dr. Shayz Ikram, Quantum Design UK and Ireland Ltd|
|10:05||Introduction to the Medical Technologies Facility | Nikolaos Kalfagiannis, Nottingham Trent University|
|10:10||Spectroscopic Ellipsometry – Theory and Fundamentals | Jeremy Van Derslice, J.A. Woollam Company|
|11:30|| Spectroscopic Ellipsometry – Applications and Data Analysis |
Jeremy Van Derslice & Andrew Martin, J.A. Woollam Company
|12:30||Infrared Spectroscopic Ellipsometry: Applications in thin film materials and liquids | Dr Nikolaos Kalfagiannis, Nottingham Trent University|
|13:00||Lunch and optional tour of laboratory|
|14:15||Overview of J.A. Woollam Spectroscopic Ellipsometers | Andrew Martin, J.A. Woollam Company|
|15:15||Spectroscopic Ellipsometry of 2D Materials (hBN and InSe) | Dr Chris Mellor, Nottingham University|
|16:00||alpha-SE Ellipsometer Demonstration | Jeremy Van Derslice & Andrew Martin, J.A. Woollam Company|