M81 SSM New Product Launch

New Product: M81 Synchronous Source Measure System

M81 SSM New Product Launch

An innovative architecture for coordinating low-level measurements from DC to 100 kHz

coming soon

The MeasureReady™ M81-SSM (Synchronous Source and Measure) system provides a confident and straightforward approach for advanced measurement applications. The M81 eliminates the complexity of multiple function-specific instrumentation setups, combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance.

The M81-SSM uses patent-pending MeasureSync™ signal synchronisation, enabling continuous data sampling on every channel. Noise and sensitivity are on par with the best scientific-grade source and measure instruments.


Components of the M81-SSM

Features

  • Unique real-time sampling architecture for synchronous sourcing and measuring
  • Designed for scientific-grade low-level measurement applications 
  • The absolute precision of DC plus the detection sensitivity performance of AC instrumentation
  • Unique, flexible instrument/distributed module architecture

Learn more about the M81-SSM


Patent-pending measurement modules

Flexible measurement capabilities

The M81-SSM provides DC and AC stimulus and measurement capabilities for characterising materials and devices in cryogenic, room temperature, and high-temperature environments. 

Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.

Flexible measurement capabilities

Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.

The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.

More about the M81-SSM

The included MeasureLINK™ software provides configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore as well as third-party systems. 

These combined capabilities make the M81‑SSM a superior solution for characterising several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.

The M81-SSM instrument

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