Innovation in X-Ray Microanalysis

IXRF designs and manufactures high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM/EDS). IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. Additionally, IXRF offers the ATLAS series of general purpose, microXRF energy dispersive X-ray fluorescence (microXRF) spectrometers for elemental analysis and hyperspectral imaging of elements from carbon (C) through uranium (U). Specialising in: SEM/EDS, SEM-XRF and microXRF.

CAPABILITIES

micro-XRF

Imaging microXRF Spectrometers

The ATLAS series of micro-XRF microscopic hyperspectral imaging spectrometers are the latest general purpose micro X-ray spot energy dispersive X-ray fluorescence (EDXRF) instruments for the measurement and mapping of elements from sodium (Na) through uranium (U).

Designed to image and analyse a wide variety of sample types, ATLAS leads the industry in virtually every major specification category from the most powerful software  (Iridium Ultra) and the largest detector active area, to our superior perpendicular geometry and smallest micro-spot.

Microanalysis

SEM/EDS — SEM-XRF — SDD

SEM/EDS:  For scanning electron microscopes (SEM), we offer a complete EDS (EDX) system: software,  SDD detectors, digital signal processor and software. The Windows^®-10 based EDS software – Iridium Ultra – delivers all-inclusive functionality.

SEM-XRF:  IXRF’s Xb micro-spot X-ray source adds the capabilities of a complete micro X-ray fluorescence (microXRF) spectrometer to any scanning electron microscope (SEM). μXRF users benefit from non-destructive measurements, superior trace element sensitivity and broader elemental coverage (Na through U) .

Sample Applications

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