26th Annual J.A. Woollam Spectroscopic Ellipsometry Workshop

For more than 25 years, Quantum Design UK and Ireland has partnered with J.A. Woollam to deliver two consecutive annual training events dedicated to spectroscopic ellipsometry. Together, these events provide a complete learning pathway for researchers, engineers, and materials scientists, whether they are encountering ellipsometry for the first time or looking to expand their expertise with the latest techniques, applications, and software developments.

The programme begins with our annual Spectroscopic Ellipsometry Workshop, designed for those new to the technique, users seeking a refresher, or anyone interested in hearing about emerging applications and recent advances in ellipsometric characterisation. This is followed by the CompleteEASE Software Training Course, for those already using a Woollam ellipsometer, an in-depth, hands-on programme focused on advanced data analysis, modelling strategies, and practical use of J.A. Woollam’s CompleteEASE software platform for ellipsometry measurements and interpretation.

The two events:

Spectroscopy Ellipsometry Workshop

  • Venue: Trinity College, Dublin
  • Date: October 27, 2026
  • FREE
  • Aimed at:
    • People interested in learning more about ellipsometry
    • And those already using it who want to:
      • have a refresher
      • learn about emerging applications
      • discover recent advances
  • Details on this page, so scroll down for more info and to register

CompleteEase Software Training Course

  • Venue: Trinity College, Dublin
  • Date: October 28 – 30, 2026
  • Cost involved
  • Aimed at:
    • Existing Users of Woollam ellipsometers wanting to learn:
      • modelling strategies
      • practical use
      • advanced data analysis
  • It is recommended that you also attend the Workshop, so please register for that too

A Beginner’s Guide to Thin-Film Measurement and Analysis

27th October, 2026

We are celebrating 26 years of Spectroscopic Ellipsometry workshops with our partners, J.A. Woollam.

This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry.  The format of the workshop includes an introduction, fundamentals of ellipsometric data analysis, and an overview of ellipsometric applications in both research and production. New emerging applications are highlighted. Our venue this year is The School of Physics, SNIAM Lecture Theatre, Trinity College, Dublin.

Application engineers from J.A. Woollam will give talks on the following topics:

  • Theory
  • Applications
  • Latest Developments
  • Data analysis

FAQs

Who is the workshop intended for?

The workshop is suitable for both newcomers to spectroscopic ellipsometry and experienced users looking to learn about the latest developments, applications, and data analysis techniques

Is there a fee to attend the workshop?

No. The annual J.A. Woollam Spectroscopic Ellipsometry Workshop is offered free of charge, making it an excellent opportunity to learn from industry experts and connect with other users.

What topics are covered during the workshop?

The workshop covers ellipsometry fundamentals, data analysis principles, real-world applications in research and manufacturing, emerging developments in the field, and presentations from J.A. Woollam application specialists.

Is the workshop suitable for researchers from different scientific disciplines?

Yes. Spectroscopic ellipsometry is widely used in materials science, semiconductors, photovoltaics, optics, thin-film technology, nanotechnology, and advanced manufacturing. The workshop demonstrates applications across a broad range of research and industrial sectors.

Will there be opportunities to ask questions and discuss applications?

Absolutely (this is our favourite bit!). The workshop encourages interaction with J.A. Woollam application engineers, experienced users, and fellow attendees, providing opportunities to discuss measurement challenges and specific application areas.

Can I attend the workshop if I do not use a J.A. Woollam ellipsometer?

Yes. The workshop is valuable for anyone interested in spectroscopic ellipsometry, regardless of their current instrument platform or level of experience. The content focuses on fundamental principles, applications, and best practices.

What are the benefits of attending before the CompleteEASE training course?

For those already using a J.A. Woollam ellipsometer, the workshop provides a solid introduction to ellipsometry theory and practical applications, helping attendees better understand the concepts that are explored in greater depth during the subsequent CompleteEASE software training course.

Why has this workshop been running for over 25 years?

The annual workshop has become a popular event because it combines practical education, expert presentations, networking opportunities, and updates on the latest developments in ellipsometry. It continues to attract both new and returning attendees from academia and industry.


Workshop Host

Christopher M. Smith M.Sc. M.Inst.P.

Christopher Smith is a Senior Experimental Officer in the School of Physics at Trinity College Dublin. He has extensive experience in ellipsometry and leads the Optical Analysis Laboratory. His work centres on thin films and nanostructured materials, including the modelling of multilayer and nanolaminate systems, with particular interest in transparent conducting oxides and transition metal oxides. He has significant experience with the Woollam M-2000 Ellipsometer platform and advanced data analysis using CompleteEASE. His current PhD research focuses on functional laminate structures, linking optical response to effective properties driven by confinement and interfacial effects.


Registration

To register your interest in attending, please complete the form below or email Angela Carslake. We will acknowledge your registration usually within a few days.


J.A. Woollam M-2000

The M-2000 is the first ellipsometer to truly excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general purpose thin film characterisation. No other ellipsometer technology acquires a full spectrum faster.

Testimonials

“Excellent introduction to SE”
Chris Morgans, Swansea University

“This week I had this chance to attend Ellipsometry workshop in Manchester University held by J.A. Woollam ‘Industry leading Ellipsometer for thin film characterisation’. It was great experience to learn more about equipment, meet experts in this field and get to know new techniques for modelling thin film thickness. Special thanks to Dr. Shayz Ikram and Angela Carslake for organising this wonderful event.
Zahra Ghaferi, Boston Scientific



Any questions ahead of the event?

Get in touch with our Technical Director, Dr. Shayz Ikram by email or call (01372) 378822.


Quantum Design UK and Ireland (QDUKI) reserves the right to use any photograph/video taken at any QDUKI event without the expressed written permission of those included within the photograph/video. We will not, however, use identifying information such as names or company/institution without your permission.


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