Webinar: Discover the Future of 3D X-ray Microscopy with EclipseXRM 🗓

<div class="event_data status-EventScheduled location-type-OfflineEventAttendanceMode " style="border-left-color:#;background:rgba(0,0,0,0.1)" itemscope itemtype="http://microformats.org/profile/hcard"> <div class="event_date" data-start="Thursday 18 July 2024" data-end="Thursday 18 July 2024"> <time itemprop="dtstart" datetime="2024-07-18T16:00:00+00:00"><span class="date date-single">July 18, 2024</span> <span class="linking_word linking_word-from">from</span> <span class="time time-start">4:00 pm</span> <span class="linking_word linking_word-to">to</span> <span class="time time-end">5:30 pm</span> </time> </div><!-- .event_date --><span class="eventpost-status">Scheduled</span> <span class="event_categories"> <span class="event_category">Webinars </span> <span class="event_category">X-Ray Microscopy / Spectroscopy </span></span></div>

Sigray Inc. is excited to unveil their latest innovation, EclipseXRM™. Director of X-ray Microscopy, Jeff Gelb, presents a groundbreaking 3D x-ray microscope (XRM) that provides the highest resolution performance on the market.

Highlights of the Webinar:

  • Unprecedented Spatial Resolution: EclipseXRM™ delivers an extraordinary 0.3 μm (300 nm) spatial resolution, including high resolution at large woresolution and the highest 3D image clarity, making it a game-changer for various applications.
  • Breakthrough Patent-pending High Efficiency Architecture using multiple x-ray sources and x-ray detectors.
  • In Situ Imaging Capabilities: Achieve submicron resolution at large working distances, enabling high-quality imaging under diverse environmental conditions.
  • Enhanced X-ray Microscope Capabilities: Learn about our AI-based software, advanced scan modes, superior phase contrast performance, and multi-spectral source for near-monochromatic imaging.

Applications and Impact:

Examples will be presented on how EclipseXRM™ has revolutionised fields in failure analysis, 3D printing, geology, battery cathode and anode device characterisation, and biological research. Its unparalleled flexibility and commercially-leading resolution performance make it the ultimate tool for researchers in busy Central Laboratories.

Discover the Sigray EclipseXRM 3D X-ray Microscope

Highest X-ray Resolution Performance

Patent-pending technology
Spatial resolution of 0.3 µm
Submicron resolution, even for large working distances

About the Speaker

Jeff Gelb

Director of X-ray Microscopy·Sigray, Inc.

Jeff is Director of X-Ray Microscopy at Sigray in Concord, California, USA, focused on next-generation 3D X-ray imaging. He studied physics at UC Santa Barbara and joined Xradia in 2006, working with multi-scale 3D tomography, which carried forward into his later work with correlative microscopy at ZEISS. Jeff completed a Master’s degree in Materials Engineering at San Jose State in 2017, with a research emphasis in developing non-destructive characterisation routines for commercial lithium-ion batteries. Jeff joined Sigray in 2017 and is excited about the future of 3D imaging, with much of his current work focused on automation, software, and data capture & processing workflows.


If you have questions ahead of the event, please contact our Technical Product Manager, Dr. Satyam Ladva, by email or call (01372) 378822.



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