The Tyndall National Institute, based in Cork, is a leading European research centre focused on advanced electronics, photonics, and materials science. Their work spans from fundamental materials development to device fabrication and modelling in cleanroom environments, with a strong emphasis on photonic technologies for telecoms, quantum, sensing, and energy applications.
“At Tyndall National Institute, we utilise the J.A. Woollam M-2000UI Spectroscopic Ellipsometer for comprehensive thin-film analysis within our cleanroom laboratories. This system plays a vital role in both research and process development, enabling us to extract precise optical constants (n, k) and film thickness across a wide range of materials used in photonics, semiconductors, and nanotechnology.”
Samira Jastan, PhD student at Tyndall National Institute/ MTU-CAPPA
The M-2000UI offers a broad spectral measurement range from 245 nm to 1690 nm, which is essential for evaluating material transparency from the deep UV to the near-infrared. This capability is particularly important for applications that demand high optical performance in the short-wavelength range, such as UV-transparent coatings and advanced dielectric layers.
Ellipsometer for thin film characterisation
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterisation. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool.
“In our experience, the J.A. Woollam Ellipsometer is an exceptionally reliable and accurate system that fully supports our need for high-resolution, non-destructive optical metrology.”
Samira Jastan, Tyndall National Institute
