The Hall effect is the primary method to measure carrier density, mobility, and carrier type of materials. In some materials, more than one carrier can exist in the sample. This webinar will explore the application of a novel Hall measurement protocol, one based on the reverse-field reciprocity theorem, AC current, and variable field for obtaining Hall data for multi-carrier analysis of such materials, including those with low mobilities. It will detail how this method allows for more precise characterisation of certain multi-carrier semiconductor devices and at faster speeds when compared with traditional AC and DC field Hall techniques.
Presented by Lake Shore Cryotronics
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Jeffrey Lindemuth, Senior Scientist, Lake Shore Cryotronics
Dr. Jeffrey Lindemuth is a Senior Scientist with Lake Shore. He received his BSc in Physics from Penn State University and his PhD in High Energy Physics from the College of William and Mary in 1982, where his research concentrated on the study of weak and strong interactions through the measurements of exotic atom x-rays. Before Lake Shore, Dr. Lindemuth was with EG&G Princeton Applied Research, concentrating on computer-aided measurements and data analysis for electrochemistry, optical spectroscopy, fiber optics, magnetic materials, and high-speed electronics. He later became Director of R&D for the company. Since joining Lake Shore in 1993, his focus has been in the development of magnetic measurement systems, including VSMs and AC susceptibility measurements as well as Hall systems and data analysis. In addition, Dr. Lindemuth performs application training, working closely with customers to help them better understand the measurements obtained from their VSM and Hall systems. He is widely recognized as an expert in instrumentation and methods for Hall measurements, particularly in semiconductor materials. For more about Dr. Lindemuth’s work, read this Q&A.