Combines the Benefits of Both DC and AC Sourcing and Measuring
Traditionally, material/device characterisation applications have required a combination of specialised DC and AC instruments – often resulting in complicated setups that also require highly skilled operators to integrate and operate equipment of mixed brands, computer interfaces, and types. Such setups often employ long cables between instruments and the sample, and as channel counts increase, so do the challenges of minimising system noise and ensuring channel-to-channel timing and reference frequency synchronisation.
This webinar explores a new approach: the use of a highly synchronised, AC + DC sourcing and measurement system that utilises remote analogue modules for optimum sensitivity and noise rejection to accurately characterise samples. The instrument architecture for directing low-level measurements from DC to 100 kHz ensures inherently synchronised data from 1 to 3 measurement channels which can be coordinated with up to 3 source channels or an external reference signal. In this way, this novel platform is highly adaptable for a range of R&D applications, including photosensor development, novel photovoltaic material characterisation, and low-noise transistor measurements.
Watch this webinar to learn how the architecture:
- Eliminates the need for mixed instrument setups by combining the capabilities of DC picoammeters, voltmeters, and AC lock-in amplifiers
- Minimises the length of signal cables, which in turn minimises cabling parasitics (leakage, noise, resistance, and reactance)
- Uses a unique real-time sampling technology to ensure synchronous sourcing and measuring across multiple channels
- Uses a single and simple touchscreen user interface that allows for easier setup and reconfiguration of a material/device characterisation application.
David Daughton, PhD, Applications Scientist, Lake Shore Cryotronics
Dr. David Daughton is an Applications Scientist with Lake Shore Cryotronics focused on characterising electronic materials and devices. He received his BS and MS in Physics from the University of Delaware and his PhD in Physics from The Ohio State University. Much of his work at OSU involved studying scanning tunnelling microscopy and optical characterisation of organic thin films at cryogenic temperatures. Since joining Lake Shore in 2011, Dr. Daughton has been the company’s principal investigator for a variety of product development projects, including recent work involving the development of a unique instrument architecture designed to provide synchronous DC, AC, and mixed DC+AC source and measure capabilities for low-level measurements. He also works extensively with Lake Shore’s line of cryogenic probe stations helping customers to configure existing Lake Shore products for specific measurements, as well as providing development support for new wafer-level characterisation capabilities.
Houston Fortney, Development Engineer, Lake Shore Cryotronics
Houston Fortney, a Development Engineer with Lake Shore Cryotronics, received his BS in Electrical Engineering from Purdue University and has been with the company since 2015. In his time with Lake Shore, he has contributed to projects relating to vibrating sample magnetometer (VSM), temperature instrument, and magnetic measurement instrument development. Primarily, he is responsible for analog circuit design, modelling and optimisation, firmware development and digital signal processing, as well as project leadership. Most recently, he has been involved with the development of innovative synchronous source and measure system for low-level material/device characterisation. Houston enjoys visiting with customers to understand their needs and aid in the development of innovative solutions to their challenges.