Dr Shayz Ikram
Product Specialist
+44 (0)1372 378822
NanoMEGAS Electron Precession Diffraction Advanced imaging and diffraction tools for transmission electron microscopy

NanoMEGAS Electron Precession Diffraction

Advanced imaging and diffraction tools for transmission electron microscopy

NanoMEGAS are a company who specialise in Electron Diffraction (ED) applications. Electron Diffraction Crystallographic Tomography for structure determination of unknown crystal phases, Automated Orientation and Phase Mapping (ASTAR) analysis, as well as strain and plastic deformation analysis (Topspin). 

All these techniques are based on Precession Electron Diffraction acquired data in TEM and are high‐end techniques that can be applied for various materials of high scientific and/or industrial interest. These state‐of‐the‐art approaches can be applied in any TEM providing results within spatial resolutions up to 1‐3nm (ASTAR, TopSPIN) when a FEG nanobeam is used. Such resolution makes these applications unique, and able to shed light to local properties of materials, like thin films, metals, batteries, ceramics, semiconductors.


  • TEM Orientation Imaging
  • TEM Strain Mapping Analysis
  • 3D Diffraction Topography
  • Enhanced EELS and EDX Spectroscopy
  • Digital STEM & TEM imaging
  • Topspin all in one platform
  • Contact: Dr Shayz Ikram
    Product Specialist

    +44 (0)1372 378822


    3D Diffraction Topography

    3D Precession Topography is the structure of complex nanocrystalline structures which can be solved ab-initio with precession electron diffraction.

    DigiSTAR-precession electron diffraction (PED) device enables the collection of quasi-kinematical intensities (X-Ray like) in any TEM.  PED in combination with powerful software (3D difffraction tomography) enables the reconstruction of the reciprocal  cell of any nanomaterial and the automatic measurement of the reflection intensities. 


    Compatible with any TEM

    Diffraction data collection with any CCD cameras

    Includes software

    TEM Orientation Imaging

    ASTAR can turn any TEM into a very powerful analytical tool enabling orientation– phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques. In combination with TOPSPIN simultaneous orientation/phase/strain /STEM maps are possible.


    Applications include:
    Materials Science
    Texture of metals is linked to specific physical properties so the need to characterise it at nm scale with novel ASTAR orientation imaging technique.

    Faster chip performances in electronic devices push copper interconnects at < 3  nm  scale, so the need for novel TEM  based  texture ASTAR characterisation technique.  Plasticity mechanism studies of freestanding Pd-films with nanoscale twins.

    Nanoparticle crystal structure and texture are very important for drug delivery and catalysis properties and need novel TEM characterisation techniques.

    TEM Strain Mapping Analysis

    Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based  on nanobeam precession diffraction patterns  in combination with DigiSTAR.  Precision up to 0.02% (200kV FEG) with spatial resolution  up to 2nm attainable (FEG-TEM).


    High spatial resolution, high precision strain mapping in modern semiconductor devices

    Acquisition of STEM reference image

    Ultra-fast nanobeam precession electron diffraction scanned acquisition

    Typical acquisition time: 5-10 min (150x150)

    Time per pixel: 10-40 ms Analysis time 5-10 min

    Automated local strain analysis via AppFive proprietary algorithm

    Acquisition from individual positions, line profiles, areas

    Spatial resolution < 2 nm attainable (FEG TEM)

    Monitor engineered strain distributions in modern semiconductor devices

    Expected sensitivity: < 2 x 10-4

    Intuitive workflow


    In combination with TOPSPIN simultaneous orientation/ phase/strain/STEM maps are possible.

    Enhanced EELS and EDX Spectroscopy

    Beam Precession in EELS & EDX spectroscopy enhance the signal reducing channelling effects. Automated quantification with statistical error analysis is available. Multiple scattering derived from an automatically measured relative thickness.


    Highly-automated EELS elemental analysis

    Minimal user input required

    Specify elements to quantify

    Chemical shift of each elemental edge

    Automated quantification with statistical error analysis

    Multiple scattering derived from an automatically measured relative thickness

    Elemental core-loss edges from several possible sources:

    •Theoretical : Hartree-Slater (Rez)

    •Experimental edges from reference materials

    Intuitive workflow

    Digital STEM & TEM imaging

    Synchronised beam scanning and precession diffraction with multi-signal data acquisition.


    Advanced control of NanoMEGAS DigiSTAR and external optical CCD camera

    Digital STEM imaging with beam precession control

    PED patterns from  multiple discrete points, lines and areas

    Assisted calibrations (camera length, distortion correction)

    On-line distortion corrected diffraction pattern acquisition

    Improved workflow  Phase and Orientation Mapping


    STEM image acquisition

    BF/DF/HAADF from STEM detectors present on the TEM

    Virtual BF/DF via external optical   CCD

    Video-rate imaging using external optical CCD camera (binocular position)

    Multiple scan modes

    Fast acquisition of diffraction patterns

    On-line distortion correction

    Suite of image processing features

    Topspin all in one platform

    Topspin is a digital STEM, Beam Precession and Analytical Experiment Framework offering a suite of beam precession-enabled imaging and advanced analytical experiments.

    Turn-key Solution (Hardware & Experiments) that upgrades your STEM to enable new advanced experiments enabled by Precession Electron Diffraction Scanned Acquisition in combination with DigiSTAR.

    Supplier info:

    For even more information, why not visit our suppliers website.