Dr Shayz Ikram
Product Specialist
+44 (0)1372 378822
J A Woollam Spectroscopic Ellipsometers - measure your film thickness and optical constants

J A Woollam Spectroscopic Ellipsometers

Measure your film thickness and optical constants by ellipsometry

Register for our Spectroscopic Ellipsometer workshop on 9th October 2018

Ellipsometry, single wavelength ellipsometry or spectroscopic ellipsometry, is a method to determine layer thickness and optical constants of thin films or substrates. An ellipsometer, either a single wavelength or a spectroscopic ellipsometer, measures the polarisation change at reflection (or transmission in case of anisotropic sample).

We offer a wide range of spectroscopic ellipsometers, optimised for your particular application. The flexible ellipsometer VASE, based on a scanning monochromator is ideal for all kinds of R&D applications, covering the widest spectral range in the market from 140 to 3200 nm, or in combination with IR-VASE up to 30 µm. Alternatively, Woollam’s fast CCD based, rotating compensator spectroscopic ellipsometers M-2000 and RC2 are available for ex-situ as well as in-situ applications. Woollam have also introduced the iSE which is designed specifically for in-situ monitoring of thickness and optical properties.


  • Rotating compensator technology
  • In-situ and Ex-Situ capability
  • Revolutionary CompleteEASE software
  • Contact: Dr Shayz Ikram
    Product Specialist

    +44 (0)1372 378822

    Supplier info:

    For even more information, why not visit our suppliers website.




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