OCCA Webinar: Spectroscopic Ellipsometry for Thin Film Characterisation 🗓

Scheduled Ellipsometers Events Webinars

Jeremy Vanderslice from J A Woollam will present this webinar which takes place on Wednesday 22 June at 14:30pm.

This webinar is hosted by the Oil & Colour Chemists’ Association (OCCA) as part of their weekly webinar series.


Spectroscopic ellipsometry is used to measure nanometer-scale layers used in microelectronics, data storage, flat panel displays and many other thin-film applications. Ellipsometers inherently detect the change in polarisation that occurs as light reflects or transmits from a material structure. The polarisation change is represented as an amplitude ratio, Ψ, and the phase difference, Δ. The measured response depends on optical properties and thickness of individual materials. Thus, ellipsometry is primarily used to determine film thickness and optical constants. However, it is also applied to characterise composition, crystallinity, roughness, doping concentration, and other material properties associated with a change in optical response. This webinar will describe the fundamental ellipsometry measurement and introduce data analysis techniques. It will also include an overview of primary applications and associated data analysis techniques. 

About the Speaker

Jeremy Vanderslice received his Master’s degree in Mechanical Engineering from the University of Nebraska. He is working towards his Ph.D. in Engineering where he is studying pulsed-laser deposited films using spectroscopic ellipsometry and is currently building a chamber for in-situ ellipsometric characterisation of PLD-grown films.

J A Woollam M2000 Spectrosopic Ellipsometer

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