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J A Woollam CompleteEase Software Training Course 2019

23 October 2019 - 24 October 2019

EVENT VENUE: National Physical Laboratory

Course Price:  £700 excluding VAT

Early bird discounted rate:  £500 excluding VAT if ordered before 16th September 2019

40% discount on rate if multiple users from the same University would like to attend

The J A Woollam CompleteEase Software Training Course is being held on Wednesday 23 and Thursday 24 October at the National Physical Laboratory.

Quantum Design UK and Ireland and J A Woollam Inc would like to involve as many users as possible to show the latest CompleteEase Version 6 software capability and advances that have been made.

The training course is an ideal opportunity to bring your own data for our experts to model but also learn the finer subtleties of using latest B- Spline/Gen Oscillator parametrization methodology to provide more accurate optical constant data.  Please see the schedule below.
To register for the Course please contact Angela Carslake on 01372 378822 or email  Please note that a Purchase Order will be required.

Lunch and refreshments will be provided.  You are encouraged to register as soon as possible as spaces are limited.

Find out more about our J A Woollam Spectroscopic Ellipsometer workshop on 22 October at NPL

Course Schedule

Day 1

  • Light and polarized light
  • Material optical properties
  • Ellipsometry fundamentals
  • Cauchy Layer
  • Transparent Materials
  • Transparent Substrates & Films

  • Common Complexities
  • Surface roughness
  • More Transparent Films
  • Saving Results (material & model files)
  • B-Spline Layer
  • B-Spline for Absorbing Materials
  • Metal Films
  • UV Absorbing Films
  • Kramers Kronig (KK) B-Spline
  • Convert Cauchy to Transparent B-Spline

Day 2

  • Gen-Osc Layer
  • Semi-Absorbing Films using the Gen-Osc Layer
  • Oscillator Model Theory
  • Commonly used oscillators
  • Applying Gen-Osc to materials with absorption

  • Thin Absorbing Films & Multi-sample Analysis
  • SE + Transmission Intensity
  • Interference Enhancement
  • Mapping Data
  • Dynamic Data (“in-situ”)
  • Uniaxial Anisotropy


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