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AFSEM: AFM in-situ SEM Seminar

18 June 2019

EVENT VENUE: Quantum Design UK and Ireland, Leatherhead

COMBINE TWO OF THE MOST POWERFUL ANALYSIS TECHNIQUES AVAILABLE!

Agenda now finalised - see below

The one day seminar will include a series of technical talks in addition to a remote demonstration of the system. Refreshments and lunch will be provided. Space is limited, so early registration using the online booking form below is encouraged. 

The GETec AFSEM is an AFM designed for integration into an SEM or FIB-SEM microscope. The AFSEM is mounted directly on the door of the microscope chamber, leaving the stage unaltered.  This, in combination with a slim tip-scanning design and self-sensing cantilevers, allows the AFSEM to be compatible with a wide range of microscopes and standard/optional stages.
 

Main benefits:

  • Correlative AFM/SEM analysis
  • Full SEM functionality maintained including FIB, FEBID and EDX
  • Multiple AFM modes in addition to topography such as Conductive AFM, KPFM, SThM, MFM
  • Can also be used as a standalone AFM outside of the SEM

Application areas:

  • In-situ electrical and magnetic characterization of nanostructures
  • In-situ micro-mechanical testing (nanoindentation, tensile stress)
  • FIB assisted nano-mechanical 3D reconstruction

Seminar Venue: 

The Quantum Design UK and Ireland office is a 5 minute walk from Leatherhead train station, which is easily accessible from London Waterloo and London Victoria terminal stations (approx 45 mins). The office is also in close proximity to J9 of the M25 and J10 of the A3.

Agenda

10:00 Registration and coffee
10:15

Welcome and introduction to Quantum Design and GETec Microscopy

Ben Parker, Quantum Design

10:30

Seeing and feeling at the nanoscale: AFM-based in-situ interactive correlated analysis

Ernest Fantner, GETec Microscopy

11:00 Coffee Break
11:15

Introduction to the AFSEM: features, operation and imaging modes

Ernest Fantner, GETec Microscopy

11:45

Self-sensing cantilever technology

Ernest Fantner, GETec Microscopy

12:15

Lunch

13:00

Remote demonstration of the AFSEM

Pinar Frank, GETec Microscopy demo lab (Vienna)

14:00 Discussion and Q&A
15:00 Meeting close

 

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