Wafer mounting in a Lake Shore Cryogenic Probe Station
When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterisation. The mounting materials and approach will influence device temperature, sample exchange time, and even the ability to post process a wafer after characterisation.
Download the application note to learn more about the mounting methods commonly used in cryogenic probe stations. It discusses in detail the methods while listing advantages and disadvantages for each, including:
- GE varnish
- Vacuum grease and clamping
- Electrically conductive silver paint, silver paste, or carbon paste compounds
- Cyanoacrylate adhesives
Still have questions or would like recommendations for your specific probing application? Please feel free to e-mail Josh Hook at firstname.lastname@example.org
New Hall effect measurement technical note
Hall effect measurements are a fundamental tool for semiconductor material characterisation. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, and at these levels, error terms can significantly impact the quality of the measurement.
This new technical note addresses the most common of these errors and recommends methods to either eliminate or minimise such errors to achieve quality Hall effect measurements.
Discuss your application in more detail. Contact Shayz Ikram at email@example.com