Correscopy Correlative Imaging

Correlative imaging across a multitude of platforms

Correlative microscopy is conventionally strictly related to the correlation of the information gathered from two types of microscopes, usually: a light microscope and a scanning electron microscope. Imaging the same location of the sample with high accuracy using various techniques has been a challenging task for many years. While many manufactures of microscopes offer equipment which allow such imaging using 2 or 3 techniques, the compromises in integrating multiple techniques into one instrument often leads to the inability to characterise the sample to the same level as dedicated devices.

Correscopy’s correlative microscopy package allows the user to perform correlative imaging of almost any microscopy or imaging technique that they (and their collaborators) have access to without modification to the imaging apparatus. This configurable package consists of several sample mount and adaptor plate options for use with a variety of microscopes, along with a software package used for storing and correlating imaging coordinates for each microscopy technique used on a sample. These coordinates can then be used to precisely overlay images using a traditional image processing software package to provide undisputed data for making clear-cut conclusions.


  • The system is fully independent of the microscope it is installed on
  • Does not require any physical modification to the microscope
  • Allows for correlative imaging using dedicated microscopes for uncompromised
    sample characterisation when compared to other correlative microscopy systems
  • Samples can be transferred between microscopes with ease using the dedicated
    holders and image correlation is straight-forward and easy to align with each transfer.
  • A wide range of adaptor plates are available for many different microscopes with custom solutions possible
  • Very affordable base package with add-ons available
  • Currently works with over 60 different microscopes spanning 12 imaging techniques

Dr Shayz Ikram

Technical Director
tel:+44 (0)1372 378822


The Correscopy sample holder can be used as a direct surface for affixing a sample or a sample plate can be affixed to the holder, for example, on a glass slide. This holder serves as the core of the correlative imaging process and contains the required reference point to be used with the software. As such, for the duration of the correlative imaging process, the sample must stay on this sample holder.

There are several readily configured sample holders available depending on your sample type and intended optical access, though custom options can be configured for specialised applications and sample orientations.

The XY Microscope adaptor plates allow the sample holder to be positioned for use in many microscopes across a wide variety of imaging types including:

  • Infrared Spectroscopy
  • Light Microscopy for Biological samples
  • Light microscopy for Metalurgical samples
  • Raman spectroscopy

These stages also have a small amount for rotation compensation in order to align the imaging axes of your sample. The standard configurations are:

  • LM_S115
  • LM_R127x78
  • LM_R127x110
  • LM_R160x110
  • LM_R170x130
  • LM_R108

Primarily designed for use with Scanning Electron Microscopes, the “Pin” microscope adaptor plates have a small pin on the back of the plate designed to fit in standard SEM configurations. The current models have a 3 mm or 10 mm pin size:

  • SEM P3
  • SEM P10

The Magnetic adapter plate currently has two models, MAG S30 and MAG S50, designed for use in:

  • Atomic Force Microscopy
  • Secondary-Ion Mass Spectrometry
  • X-ray Photoelectron Spectroscopy
  • Optical / 3D Surface Profilometry
  • Nanoindentation
  • Light microscopy for Metalurgical samples

Correscopy’s dedicated correlative imaging software allows the user to coordinate and collate information in order to correctly and precisely align overlapping image data. Within the software, the user is guided through the imaging process by:

  • Defining devices
  • Creating a library of devices
  • Defining areas of interest on the sample
  • Locating the above areas on any device
  • Editing and planning projects

The program then provides the user with the information required to overlap the image data within their preferred software to create the correlated images. The software package is easy to use with step-by-step instructions as your project progresses. It is included as part of the base Correscopy Correlative Imaging package with the appropriate licence keys.

Correscopy also offers MountainsMap from Digital Surf for image processing. This forms an end to end solution from image acquisition to image processing when purchased with the Correscopy Correlative Imaging package.

The Correscopy Correlated Imaging system has been tested with over 60 microscopes spanning 12 different imaging techniques. The list below contains the microscopes currently verified as compatible with this system, however, this list will grow with every user and should be only be used for reference. If you are a user of the Correscopy Correlated Imaging system and your microscope is not yet included, please e-mail the product contact and we will add it to the list.

Microscopy Technique Manufacturer Microscope Model
Light Microscopy KEYENCE VHX
Eclipse ME600
Eclipse Ni
Eclipse Ti 2
Labophot-2 (1980’s)
ZEISS Axio Lab.A1
Axio Observer Z1m
Axio Imager
Primo Star
Fluorescent / Confocal Microscopy LIECA DMI 6000 CS
IX 71
ZEISS Axiovert
LSM 510
LSM 710
LSM 880 (+Airyscan)
Scanning Electron Microscopy COXEM EM30 (desktop SEM)
FEI Helios
Quanta FEG 250
JEOL JSM 5410 (1994)
JSM 6480
JSM 6701F
PHENOM XL (desktop SEM)
TESLA BS340 (1989)
ZEISS Merlin
Infrared Spectroscopy ANASYS INSTRUMENTS nanoIR2
BRUKER Hyperion 3000
Nicolet Continuum
Raman Spectroscopy HORIBA Labram HR
RENISHAW inVia confocal Raman Microscope
inVia Qontor
inVia µRaman (with Leica LM)
Atomic Force Microscopy ASYLIUM RESEARCH MFP 3D BIO
BRUKER Catalyst (with Zeiss LM)
Catalyst (with Leica LM)
NANOSURF Easyscan 2
Optical Profilometry ZYGO Zegage
3D Surface Profiler SENSOFAR S lynx
X-ray Photoelectron Spectroscopy KRATOS Supra
Secondary-Ion Mass Spectrometry ION-TOF TOF.SIMS 5
Nanoindentation CSM Nanoindenter
HYSITRON (BRUKER) TI 950 TriboIndenter
Correlative Microscopy WITEC Alpha



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