Renaissance Scientific Cryogenic Atomic Force Microscopes

Based on their innovative nanopositioner stages, Renaissance Scientific have brought to the market a solution for bringing AFM to the Cryo domain. With IR, Cantilever and Diamon NV Centre options, these solutions really are at the leading edge.

Renaissance Scientific has qualified the Quantum Design OptiCool for SPM, Ren-Sci will guarantee performance of their AFMs with the OptiCool.  Most liquid helium cryostats are compatible, though check with us to make sure.

For example:

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David Want Quantum Design UK and Ireland
Name

DAVID WANT

Job Title

Product Specialist

Phone
Email
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Name

TECHNICAL SALES TEAM

Job Title

Support Team

Phone
Email
Profile
Name

ASHLEY CRANE

Job Title

Sales Manager

Phone
Email
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Dr Jordan Thompson Quantum Design UK and Ireland
Name

JORDAN THOMPSON

Job Title

Service Engineer

Phone
Email
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Quantum Design UK and Ireland Dr Shayz Ikram
Name

DR SHAYZ IKRAM

Job Title

Product Specialist

Phone
Email
Profile
Name

JOSH HOOK

Job Title

Sales/Service Support Engineer

Phone
Email
Profile

Name

LUKE NICHOLLS

Job Title

Technical Sales Engineer

Phone

+44 (0)1372 378822

Email

luke@qd-uki.co.uk

MODELS

IR-AFM-4K – Atomic Force Microscope

CRYO IR NEAR-FIELD MICROSCOPY

-Cantilever AFM
-0.48 NA focus on tip
-Independent tip and sample temperature control
-dual Z scanner (long range for offset control + short range high bandwidth for sharp sample features)
-12 sample contacts
-Piezo motor controlling fibre to cantilever

NV-AFM-4K-111T – Atomic Force Microscope

CRYO DIAMOND NV CENTER MAGNETOMETRY

-Quartz Tuning Fork (QTF) tips (not supplied)

-0.64 NA objective lens
-Independent sample temperature control
-dual Z scanner (long range for offset control + short range high bandwidth for sharp sample features)
-12 sample contacts

– XYZ nanopositioning on tip (NP-240)
– XYZ nanopositioning on sample (NP-340)
– XY and dual Z scanning on sample – Plug-and-play Quartz Tuning Fork (QTF) mounts

– Two stage QTF preamplifier with charge amplifier on each tine and differential second stage – Note: requires 3rd party NV centre probes

-Controlled with RHK R9 or R10 controllers

AFM-340 – Atomic Force Microscope

CRYOGENIC CANTILEVER AFM

-Sample XYZ nanopositioning (NP-340-XYZ)

-Sample Scanning XY and dual Z

-Fibre-to-cantilever piezo motor

-Optical drive

-Controlled with RHK R9 or R10 controllers

Supplier Info

For even more information, why not visit our suppliers website.

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