PRODUCT CONTACT:

David Want
Managing Director
+44 (0)1372 378822




AttoMap

X-Ray analytical microscope with synchrotron capabilities

Sigray, Inc. develops advanced and completely new approaches to x-ray technology that formerly could only be found in synchrotron beamline experimental setups. The µ-XRF system from Sigray, AttoMap™  combines the resolution and the sensitivity from synchrotron XRF results and combines them into a laboratory-based instrument. Beside the AttoMap™  x-ray fluorescence system, Sigray is also offering proprietary x-ray optics and a new and breakthrough x-ray source named FAAST™.

The AttoMap™ x-ray analytical microscope offers the highest resolution and the highest sensitivity one can find in a laboratory based microXRF system. The AttoMap™ system can be used for transmission-based x-ray structural analysis as well as for fluorescence chemical mapping. The system has a chemical sensitivity of <1-10 ppm for trace element analysis and the measuring time is within 1 second.

The patented FAAST™ microfocus x-ray source (Fine Anode Array Source Technology) is based on a complete new x-ray source design.  The x-ray target is made out of fine metal microstructures that are encapsulated in a diamond substrate. This complete new design was enabled due to recent developments in semiconductor processing techniques.

Contact: David Want
Managing Director
+44 (0)1372 378822
david@qd-uki.co.uk

SPECIFICATION OVERVIEW

  • FEATURES:
  • The key advantages of the AttoMap™ system compared to standard µXRF systems are three major innovations developed by Sigray.
    1. The patented FAAST™ x-ray source with 50X higher brightness than microfocus sources used in standard microXRFs
    2. Proprietary, high efficiency x-ray mirror lens that provides a combination of small achromatic focus and large working distance for superior detection sensitivity and accuracy
    3. Unique detector geometry enabled by the design of the x-ray mirror lens that collects 10X more fluorescence x-rays than conventional designs.
  • These innovations provide the AttoMap™ with the ultimate laboratory microXRF performance:
  • Substantially higher resolution at single digit microns-scale (e.g. 3-5 µm MTF) resolution versus conventional microXRF allowing detection of nanoparticles down to 50-100 nm
  • Dramatically faster analytical speed of a single minute - rather than a half day - for equivalent measurements on an AttoMap™ versus a conventional microXRF with up to 500X higher throughput
  • Sub-ppm and sub-femtogram sensitivity in seconds, >100X the sensitivity of standard microXRF
  • Only microXRF that can map trace elements (conventional microXRF is capable of mapping only major constituents at reasonable throughputs, as it requires long spot acquisition times for trace elements)
  • Most accurate quantification capabilities and optional dual energy source for maximum flexibility
  • Ability to analyze buried microfeatures
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  • The AttoMap system
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